报告题目：Modern surface metrology and application in advanced manufacturing

报告人：Dr Wenjuan Sun(National Physical Laboratory, United Kingdom)

讲座时间：2017-12-23上午9:30-11:00

讲座地点：正禾宾馆东3会议室

邀请人：杨广珺、姚磊江

承办学院：无人机重点实验室

联系人：张勇祯

联系电话：17749125677

报告简介：

Surface metrology is widely used in many industries including automotive and aerospace. The significant growth of advanced manufacturing, requires measurements of surfaces with complex external and internal structures, where conventional 2D profile measurements and destructive measurements cannot meet the needs. The talk will discuss challenges faced in advanced manufacturing and will introduce the latest development of surface metrology at the National Physical Laboratory (NPL), UK. Several case studies will be given. The talk will also introduce the current state-of-the-art traceable measurement framework at NPL and the latest development of international standards in the field of surface metrology.

报告人简介：

Dr Wenjuan Sun is EPSRC tomography roadmap, working group member, Dimensional X-ray Computed Tomography(XCT) Conference Conference Chair, Co-chair , UK user group coordinator, International Organization for Standardization, British Standards Institute committee ISO/TC 213 WG10, WG16 Committee member, National Physical Laboratory, UK X-ray computed tomography Project formulation, project management PhD student supervisor, national and international secondments. Main area of interests: X-ray Computed tomography, Optical CMM, Additive Manufacturing.